Conference paper
High speed device testing and internal node diagnostics
George Chiu, Jean-Marc Halbout, et al.
Microlithography 1987
Attenuation and dispersion characteristics for different modes of dielectric waveguides fabricated on silicon have been characterized by measuring the propagation of short pulses using a synchroscan streak camera. © 1990, IEEE
George Chiu, Jean-Marc Halbout, et al.
Microlithography 1987
Yvon Pastol, Jean-Marc Halbout, et al.
IEEE Electron Device Letters
G.V. Treyz, P.G. May, et al.
Applied Physics Letters
Santanu Basu, Paul May, et al.
ASSL 1989