PaperAnode hole injection and trapping in silicon dioxideD.J. DiMaria, E. Cartier, et al.Journal of Applied Physics
PaperLocation of positive charges in SiO2 films on Si generated by vuv photons, x rays, and high-field stressingD.J. DiMaria, Z.A. Weinberg, et al.Journal of Applied Physics
PaperCharacterization of plasma-enhanced chemically-vapor-deposited silicon-rich silicon dioxide/thermal silicon dioxide dual dielectric systemsS. Yokoyama, D.W. Dong, et al.Journal of Applied Physics
