Xiao Sun, Christopher P. D’Emic, et al.
VLSI Technology 2017
We use ultrahigh vacuum chemical vapor deposition to grow polycrystalline silicon carbide (SiC) on c-plane sapphire wafers, which are then annealed between 1250 and 1450°C in vacuum to create epitaxial multilayer graphene (MLG). Despite the surface roughness and small domain size of the polycrystalline SiC, a conformal MLG film is formed. By planarizing the SiC prior to graphene growth, a reduction in the Raman defect band is observed in the final MLG. The graphene formed on polished SiC films also demonstrates significantly more ordered layer-by-layer growth and increased carrier mobility for the same carrier density as the nonpolished samples. © 2011 American Institute of Physics.
Xiao Sun, Christopher P. D’Emic, et al.
VLSI Technology 2017
Sufi Zafar, Christopher P. D’Emic, et al.
ACS Nano
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IEDM 2013
Guohan Hu, J. J. Nowak, et al.
VLSI-TSA 2017