Chenyu Wen, Shuangshuang Zeng, et al.
ACS Sensors
We use ultrahigh vacuum chemical vapor deposition to grow polycrystalline silicon carbide (SiC) on c-plane sapphire wafers, which are then annealed between 1250 and 1450°C in vacuum to create epitaxial multilayer graphene (MLG). Despite the surface roughness and small domain size of the polycrystalline SiC, a conformal MLG film is formed. By planarizing the SiC prior to graphene growth, a reduction in the Raman defect band is observed in the final MLG. The graphene formed on polished SiC films also demonstrates significantly more ordered layer-by-layer growth and increased carrier mobility for the same carrier density as the nonpolished samples. © 2011 American Institute of Physics.
Chenyu Wen, Shuangshuang Zeng, et al.
ACS Sensors
Guohan Hu, J. J. Nowak, et al.
VLSI-DAT 2017
Luqiao Liu, Anthony Richardella, et al.
Physical Review B - CMMP
Kadir Cil, Faruk Dirisaglik, et al.
IEEE T-ED