Kerem Unal, H. Kumar Wickramasinghe
Applied Physics Letters
Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-costway to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging atmultiple IRwavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometerscale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.
Kerem Unal, H. Kumar Wickramasinghe
Applied Physics Letters
Yves C. Martin, H. Kumar Wickramasinghe
Journal of Applied Physics
Yves Martin, H. Kumar Wickramasinghe
Applied Physics Letters
Yves Martin, David W. Abraham, et al.
Applied Physics Letters