P.A. Moskowitz, S.M. Faris, et al.
IEEE Transactions on Magnetics
The time-averaged current induced by incident radiation across electronic tunneling junctions is shown experimentally and theoretically to have a highly nonlinear dependence on the field intensity for a range of tunneling barrier thickness.
P.A. Moskowitz, S.M. Faris, et al.
IEEE Transactions on Magnetics
S.M. Faris, N.F. Pedersen
Physica B+C
D.J. Frank, M. Tinkham, et al.
Physical Review Letters
S.M. Faris, S.I. Raider, et al.
IEEE Transactions on Magnetics