N.C.-C. Lu, T.V. Rajeevakumar, et al.
IEDM 1988
An experiment was carried out to study oxidation-enhanced and oxidation-retarded diffusion (OED and ORD) of Sb in (100) and (111) Si wafers oxidized in dry O2 at 1160°C. The ORD data of (100) wafers agree well with those of Mizuo and Higuchi and with the prediction of a model assuming that Si self-interstitials and vacancies coexist in Si in thermal equilibrium at high temperatures. A small adjustment to the interstitial supersaturation values is needed to bring the ORD/OED data of (111) wafers to fit with the model satisfactorily. This indicates the existence of a mechanism which injects vacancies into (111) wafers in addition to the normal mechanism of interstitial injection due to SiO2 growth.
N.C.-C. Lu, T.V. Rajeevakumar, et al.
IEDM 1988
B.J. Ginsberg, M. Arienzo, et al.
ECS Meeting 1983
T.Y. Tan, U. Gosele
ECS Meeting 1983
E. Rimini, W.K. Chu, et al.
Applied Physics Letters