Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
The rearrangement inequality states that the sum of products of permutations of 2 sequences of real numbers are maximized when the terms are similarly ordered and minimized when the terms are ordered in opposite order. We show that similar inequalities exist in algebras of multi-valued logic when the multiplication and addition operations are replaced with various T-norms and T-conorms respectively. For instance, we show that the rearrangement inequality holds when the T-norms and T-conorms are derived from Archimedean copulas.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Mario Blaum, John L. Fan, et al.
IEEE International Symposium on Information Theory - Proceedings
Heng Cao, Haifeng Xi, et al.
WSC 2003
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007