A. Skumanich
SPIE OE/LASE 1992
Some theoretical and practical aspects of common random numbers (CRN) for variance reduction in simulation analysis are considered. A simple proof of the optimality of CRN is presented and the efficiency of this technique for variance reduction is discussed. Applications of CRN to production planning and inventory problems while using stochastic approximation are given. © 1984.
A. Skumanich
SPIE OE/LASE 1992
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Harpreet S. Sawhney
IS&T/SPIE Electronic Imaging 1994
Michael E. Henderson
International Journal of Bifurcation and Chaos in Applied Sciences and Engineering