J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
The principles of optical tomography are discussed, and recent developments that promise to overcome some of the problems in the implementation of this exiting optical method for the non-destructive evaluation of samples are reviewed. Recent progress in spectral imaging, sectioning microscopy and photothermal and photoacoustic evaluation of optically opaque samples are included to give a up-to-date picture of this evolving technique. © 1995, All rights reserved.
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J.H. Stathis, R. Bolam, et al.
INFOS 2005
E. Burstein
Ferroelectrics