A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The effectiveness of different oxidizer gases (O, O2, N2O and NO2) for the post-growth oxidation of YBa2Cu3O7-γ (YBCO) thin films is investigated. In particular, the oxidation process in the presence of atomic and molecular oxygen is analyzed based on a simple kinetic model involving oxygen adsorption, desorption, and interface transfer steps. It is argued that the high oxidation capability of atomic O is a result of its direct adsorption with very high sticking probability. As a result, the thermodynamic stability range of YBCO at a particular temperature is shifted to significantly lower pressures in an atomic O plasma. On the basis of the known surface decomposition characteristics of N2O and NO2, the possible oxidation behavior of YBCO films in the presence of these gases is also discussed. © 1993.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
P. Alnot, D.J. Auerbach, et al.
Surface Science
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters