Simulation of section curve by phase constant dynamic mode atomic force microscopy in non-contact situation
- H. Nanjo
- L. Nony
- et al.
- 2003
- Applied Surface Science
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The Cu(1 0 0)-c(2 × 2) N structure studied by combined nc-AFM/STM
- S. Schär
- R. Bennewitz
- et al.
- 2003
- Applied Surface Science
Dynamic AFM using the FM technique with constant excitation amplitude
- B. Gotsmann
- H. Fuchs
- 2002
- Applied Surface Science
In-situ nanoscale characterization of composition and structure during formation of ultrathin nickel silicide
- Tuan T. Tran
- Christian Lavoie
- et al.
- 2021
- Applied Surface Science
Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs
- J. Debehets
- P. Homm
- et al.
- 2018
- Applied Surface Science
FIM tips in SPM: Apex orientation and temperature considerations on atom transfer and diffusion
- William Paul
- David Oliver
- et al.
- 2014
- Applied Surface Science
Ion beam nanoscale fabrication and lithography - A review
- J.E.E. Baglin
- 2012
- Applied Surface Science
Impurity measurements in silicon with D-SIMS and atom probe tomography
- P.A. Ronsheim
- P. Flaitz
- et al.
- 2008
- Applied Surface Science
Quantitative depth profiling of photoacid generators in photoresist materials by near-edge X-ray absorption fine structure spectroscopy
- Vivek M. Prabhu
- Sharadha Sambasivan
- et al.
- 2006
- Applied Surface Science
Kinetic effects in heteroepitaxial growth
- 2002
- Applied Surface Science