Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed. © 1988 Springer-Verlag.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
K.A. Chao
Physical Review B