Thomas M. Cover
IEEE Trans. Inf. Theory
A newly developed optical method for noninvasively measuring the switching activity of operating CMOS integrated circuit chips is described. The method, denoted as picosecond imaging circuit analysis (PICA) can be used to characterize the gate-level performance of such chips and identify the locations and nature of their operational faults. The principles underlying PICA and examples of its use are discussed.
Thomas M. Cover
IEEE Trans. Inf. Theory
Yigal Hoffner, Simon Field, et al.
EDOC 2004
Pradip Bose
VTS 1998
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989