Diagnosis and characterization of timing-related defects by time-dependent light emission
- D.R. Knebel
- P.N. Sanda
- et al.
- 1998
- IEEE ITC 1998
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3 results for David P. Vallett
Time-resolved optical characterization of electrical activity in integrated circuits
- James C. Tsang
- Jeffrey Alan Kash
- et al.
- 2000
- Proceedings of the IEEE
Picosecond imaging circuit analysis
- James C. Tsang
- Jeffrey A. Kash
- et al.
- 2000
- IBM J. Res. Dev