Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
A quantitative comparison study of single-level step-edge junction-based SQUIDs and bicrystal-substrate-based SQUIDs is given. Similar SQUID performance was found in terms of white flux noise level and junction-critical-current-related 1/f noise. Excess current was found in most step-edge devices. Issues related to systems applications, such as magnetic field-induced noise, junction cyclability upon repeated use, and environmental stability of oxide-metal contacts are also discussed. © 1995 IEEE
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
A. Krol, C.J. Sher, et al.
Surface Science
R.W. Gammon, E. Courtens, et al.
Physical Review B