J.K. Gimzewski, T.A. Jung, et al.
Surface Science
We have used photoluminescence from nonequilibrium electrons recombining at neutral acceptors to quantitatively measure hot electron kinetics in GaAs. Values have been obtained for intervalley scattering rates as a function of electron kinetic energy and the scattering rate of a single nonequilibrium electron in the presence of a sea of thermalized carriers. These measurements demonstrate the power of this new probe of nonequilibrium carrier relaxation in direct gap semiconductors. © 1989.
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Hiroshi Ito, Reinhold Schwalm
JES