M.W. Wang, D.A. Collins, et al.
Applied Physics Letters
Scanning tunneling microscopy is used to confirm the -bonded chain structure of the Si(111)2×1 surface. Both the amplitude and voltage dependence of the vertical corrugation exclude the buckling model for the structure of this surface. Spectroscopic measurements of the tunneling current versus voltage identify a band gap for the 2×1 surface states. Spatial images of disorder-related states are obtained by tunneling at energies inside of this band gap. © 1986 The American Physical Society.
M.W. Wang, D.A. Collins, et al.
Applied Physics Letters
P.N. First, R.A. Dragoset, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
R.M. Feenstra, D.A. Collins, et al.
Superlattices and Microstructures
W.A. Thompson, F. Holtzberg, et al.
Physical Review Letters