I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Our experimental attenuated-total-internal-reflection curves for Ag films are reanalyzed to include the thin contamination layer which has been proposed by W. H. Weber to account for the observed differences in the optical constants at the metal-air and metal-liquid interfaces. In contradiction to Weber's claim, the Drude parameters of the Ag film still show the same behavior as when this adlayer is ignored. © 1986 The American Physical Society.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Mark W. Dowley
Solid State Communications
Kenneth R. Carter, Robert D. Miller, et al.
Macromolecules
K.A. Chao
Physical Review B