William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Our experimental attenuated-total-internal-reflection curves for Ag films are reanalyzed to include the thin contamination layer which has been proposed by W. H. Weber to account for the observed differences in the optical constants at the metal-air and metal-liquid interfaces. In contradiction to Weber's claim, the Drude parameters of the Ag film still show the same behavior as when this adlayer is ignored. © 1986 The American Physical Society.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Imran Nasim, Melanie Weber
SCML 2024
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