Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
The resonance line shapes in the specular intensity for He diffraction from Ni(110)+ H(1 × 2) are calculated using a hard corrugated surface model with a well, and compared with experimental results. It is shown that the asymmetry of the resonance lines can be used to resolve the ambiguity whether the corrugation function +D(x, y) or -D(x, y) describes the surface profile. © 1981.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Peter J. Price
Surface Science
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano