A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The resonance line shapes in the specular intensity for He diffraction from Ni(110)+ H(1 × 2) are calculated using a hard corrugated surface model with a well, and compared with experimental results. It is shown that the asymmetry of the resonance lines can be used to resolve the ambiguity whether the corrugation function +D(x, y) or -D(x, y) describes the surface profile. © 1981.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
Julien Autebert, Aditya Kashyap, et al.
Langmuir
R. Ghez, J.S. Lew
Journal of Crystal Growth