I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Scanning Tunneling Microscopy (STM) on boron-doped, p-type Si(111) confirmed the main structural features of the 7 × 7 reconstruction of nearly intrinsic n-type material, in particular the three-fold rotational symmetry. In the p-doped material, one distinct maximum is absent in about every fifth cell. This is attributed to a surface-boron dopant, implying an appreciable surface segregation of boron. © 1985.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
J. Tersoff
Applied Surface Science
R. Ghez, J.S. Lew
Journal of Crystal Growth