A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Wide-angle X-ray diffraction (WAXD), small-angle light, light scattering and birefringence were used to investigate the temperature dependence of the morphology of poly[bis(trifluoroethoxy)phosphazene]. Experiments conducted on solution cast films revealed a spherulitic morphology in the range 25-225 °C. Structural changes, associated with the transformation to the mesomorphic state, were found to occur in the temperature range 70-90 °C. Above the melting point, the material was isotropic by optical techniques and amorphous by WAXD. The results are discussed in terms of changes in molecular ordering. © 1984, American Chemical Society. All rights reserved.
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
A. Gangulee, F.M. D'Heurle
Thin Solid Films
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Surface Science
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Microelectronic Engineering