IEEE Circuits and Devices Magazine

Paper

01 Jan 1994

Scaling, Small Numbers and Randomness in Semiconductors

View publication

Abstract

No abstract available.

Paper

Heat Transfer in Forced Convection Through Fins

Robert W. Keyes

IEEE T-ED

Paper

Device Implications of the Electronic Effect in the Elastic Constants of Silicon

Robert W. Keyes

IEEE Transactions on Sonics and Ultrasonics

Paper

The effect of randomness in the distribution of impurity atoms on FET thresholds

Robert W. Keyes

Applied Physics

Paper

The Evolution of Digital Electronics Towards VLSI

Robert W. Keyes

IEEE T-ED

View all publications