Paper
Explaining strain
Robert W. Keyes
IEEE Circuits and Devices Magazine
A model of the effect of random fluctuations in the number of impurity atoms in the depletion layer of a field-effect transistor (FET) is presented and analyzed. It is concluded that the range of space charge per unit area that must be anticipated on a chip containing N FET's each of area A is n is the doping level of the substrate. Copyright © 1975 by The Institute of Electrical and Electronics Engineers, Inc.
Robert W. Keyes
IEEE Circuits and Devices Magazine
Robert W. Keyes
Physical Review Letters
Robert W. Keyes
IEEE JSSC
Robert W. Keyes
Proceedings of the IEEE