Conference paper
Overview paper scanning near-field microscopies
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
In certain problems of electrical transport through condensed matter, it is important to know the potential distribution with microscopic resolution, e.g., at interfaces (Schottky barriers) or pn junctions. Scanning tunneling potentiometry, a new application of scanning tunneling microscopy, is capable of providing this information. The tunnel current is used for simultaneously sensing probe-to-sample distance and local potential. The method was tested with a gold-island metal-insulator-metal structure.
D. Pohl, J.K. Gimzewski
Optics in Complex Systems 1990
B. Hecht, H. Bielefeldt, et al.
Journal of Applied Physics
U. Dürig, O. Züger, et al.
Journal of Microscopy
H. Heinzelmann, D. Pohl
Applied Physics A Solids and Surfaces