F.F. Morehead, R.F. Lever
Applied Physics Letters
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead, R.F. Lever
Applied Physics Letters
F.F. Morehead
Journal of Applied Physics
G. Mandel, F.F. Morehead
IEEE T-ED
F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics