F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics
F.F. Morehead, R.F. Lever
Applied Physics Letters
F.F. Morehead
Journal of Applied Physics
T.Y. Tan, U. Gösele, et al.
Applied Physics A Solids and Surfaces