F.F. Morehead
Journal of Materials Research
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead
Journal of Materials Research
F.F. Morehead, G. Mandel
Physical Review
R.S. Title, G. Mandel, et al.
Physical Review
F.F. Morehead
Physical Review B