F.F. Morehead, G. Mandel
Applied Physics Letters
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
F.F. Morehead, G. Mandel
Applied Physics Letters
F.F. Morehead, G. Mandel
Physics Letters
F.F. Morehead, B.L. Crowder, et al.
Journal of Applied Physics
F.F. Morehead
Journal of Applied Physics