G. Mandel, F.F. Morehead
IEEE T-ED
We present an analysis of gold diffusion profiles in silicon taking into account that both self-interstitials and vacancies are present at thermal equilibrium. We find that at 1000°C the contribution of self-interstitials to silicon self-diffusion is about equal to that of vacancies.
G. Mandel, F.F. Morehead
IEEE T-ED
R.T. Hodgson, V.R. Deline, et al.
MRS Proceedings 1983
F.F. Morehead
Physical Review B
F.F. Morehead, G. Mandel
Physics Letters