Ming L. Yu
Physical Review B
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
Ming L. Yu
Physical Review B
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Hiroshi Ito, Reinhold Schwalm
JES
Dipanjan Gope, Albert E. Ruehli, et al.
IEEE T-MTT