Ming L. Yu
Physical Review B
A model for reactive Schottky barrier formation is proposed and applied to silicide contacts on silicon. Approximate workfunctions calculated assuming a silicon excess near the silicide/silicon interface reconcile measured barrier heights with a simple Schottky description of their energetics. © 1980.
Ming L. Yu
Physical Review B
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
J.A. Barker, D. Henderson, et al.
Molecular Physics