Z.H. Ming, Y.L. Soo, et al.
Applied Physics Letters
SiGe epitaxial growth on Si has been of interest for a number of years. In this work we consider the addition of 1 to 6% C into both Si and SiGe epitaxial material. We have used a solid, and a gas source, (acetylene), within a solid source SiGe molecular beam epitaxy system to produce a C flux. We have produced high-crystalline-quality Si1-yCy and Si1-x-yGexCy material using both approaches. In addition we demonstrate strain-symmetrical short-period superlattice structures grown on (100) Si with high Ge compositions ranging from 20% up to 100% Ge, at 100% Ge the Ge/Si1-xCy superllatice has an interface mismatch of 7%.
Z.H. Ming, Y.L. Soo, et al.
Applied Physics Letters
S.L. Delage, S.-J. Jeng, et al.
Applied Physics Letters
C.-Y. Ting, M. Wittmer, et al.
VLSI Science and Technology 1983
P.R. Pukite, Subramanian S. Iyer, et al.
Applied Physics Letters