Ring oscillator based test structure for NBTI analysis
Mark B. Ketchen, Manjul Bhushan, et al.
ICMTS 2007
A test structure suite to measure circuit delays, power, and operating margins of single flux quantum (SFQ) circuits and to derive key parameters directly from dc testable high-speed circuits is described. This suite comprises a set of ring oscillators and a time-differential experiment as well as isolated circuit components. Measured data are compared to the results obtained from circuit simulations conducted in a design environment used for more complex chip designs. This approach, which enables tracking of process technology and validation of device and circuit models in a self-consistent manner, is inspired by a similar methodology for silicon technology deployed successfully by IBM and its alliance partners.
Mark B. Ketchen, Manjul Bhushan, et al.
ICMTS 2007
Mark B. Ketchen, Manjul Bhushan, et al.
Review of Scientific Instruments
Mark B. Ketchen, Manjul Bhushan, et al.
ICMTS 2009
Mark B. Ketchen, John Timmerwilke, et al.
IEEE TAS