Simulation and 18 Gb/s testing of a data-driven self-timed rsfq demultiplexer

Abstract

We have developed a Data-Driven Self-Timed (DDST) Rapid-Single-Flux-Quantum (RSFQ) demultiplexer (demux) for the interface between on-chip high-speed RSFQ circuits and off-chip low-speed circuits. In order to eliminate the timing issue in a synchronous clocking system we employed the DDST architecture, where a clock signal is localized within a 2bit basic demux module and dual rail lines are used to transfer the timing information between the modules. A larger demux can be produced simply by connecting the 2-bit modules in a tree structure. The DDST demux was designed for 10 Gb/s operation with sufficient dc bias margin using HYPRES 1 kA/cm2 Nb process. We have successfully tested operation of the 2-bit demux up to 18 GHz using the DDST on-chip high-speed test system which was developed in our group. © 1999 IEEE.