Gal Badishi, Idit Keidar, et al.
IEEE TDSC
The soft-error resilience of the IBM POWER6™ processor I/O (input/ output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle to high I/O bandwidth and utilization. The POWER6 processor and I/O hub subsystem work together to maintain resiliency even under strenuous irradiation conditions. © Copyright 2008 by International Business Machines Corporation.
Gal Badishi, Idit Keidar, et al.
IEEE TDSC
Hans Becker, Frank Schmidt, et al.
Photomask and Next-Generation Lithography Mask Technology 2004
Lerong Cheng, Jinjun Xiong, et al.
ASP-DAC 2008
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011