Statistical fault injection
- Pradeep Ramachandran
- Prabhakar Kudva
- et al.
- 2008
- DSN 2008
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32 results for P.N. Sanda
Soft-error resilience of the IBM POWER6 processor
- Pia N. Sanda
- Jeffrey W. Kellington
- et al.
- 2008
- IBM J. Res. Dev
Soft-error resilience of the IBM POWER6 processor input/output subsystem
- Carl Bender
- Pia N. Sanda
- et al.
- 2008
- IBM J. Res. Dev
Phaser: Phased methodology for modeling the system-level effects of soft errors
- Jude A. Rivers
- Pradip Bose
- et al.
- 2008
- IBM J. Res. Dev
I/O interface latchup analysis using optical and electrical testing
- Franco Stellari
- Peilin Song
- et al.
- 2004
- Electronic Device Failure Analysis
Optical and Electrical Testing of Latchup in I/O Interface Circuits
- Franco Stellari
- Peilin Song
- et al.
- 2003
- IEEE ITC 2003
Study of Critical Factors Determining Latchup Sensitivity of ICs using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- ISTFA 2003
Latchup Analysis Using Emission Microscopy
- Franco Stellari
- Peilin Song
- et al.
- 2003
- Microelectronics Reliability
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latch up
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003
Transmission line pulse picosecond imaging circuit analysis methodology for evaluation of ESD and latchup
- Alan Weger
- Steven Voldman
- et al.
- 2003
- IRPS 2003