Conference paperUnderstanding short-term BTI behavior through comprehensive observation of gate-voltage dependence of RTN in highly scaled high-κ / metal-gate pFETsHiroshi Miki, M. Yamaoka, et al.VLSI Technology 2011
Conference paperImpact of HK / MG stacks and future device scaling on RTNNaoki Tega, Hiroshi Miki, et al.IRPS 2011
Conference paperAn anomalous correlation between gate leakage current and threshold voltage fluctuation in advanced MOSFETsZihong Liu, Paul Chang, et al.IEDM 2010
PaperArrays of single-walled carbon nanotubes with full surface coverage for high-performance electronicsQing Cao, Shu-Jen Han, et al.Nature Nanotechnology