Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Let K be a subspace of Rn and let K⊥ be the orthogonal complement of K. Rockafellar has shown that certain properties of K may be characterized by considering the possible patterns of signs of the nonzero components of vectors of K and of K⊥. Such considerations are shown to lead to the standard characterization theorem for discrete linear Chebyshev approximation as well as to several results on uniqueness of solutions. A method is given for testing uniqueness of a given solution. A special case related to graph theory is discussed and combinatorial methods are given for solving and testing for uniqueness. © 1976.
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Nimrod Megiddo
Journal of Symbolic Computation
F.M. Schellenberg, M. Levenson, et al.
BACUS Symposium on Photomask Technology and Management 1991