Ivan Haller, Ralph Feder, et al.
JES
We point out the advantages of the use of x-ray resist as the recording medium in contact x-ray micrography, with subsequent viewing under the scanning electron microscope. Untreated specimens may be replicated with a resolution better than 100 nm. Photographs of latex spheres obtained by this technique are presented.
Ivan Haller, Ralph Feder, et al.
JES
Eberhard Spiller, John Harper
Applied Optics
David Sayre
Science
Robert W. Eason, David K. Bradley, et al.
Proceedings of SPIE 1989