Paper
The DX centre
T.N. Morgan
Semiconductor Science and Technology
Monolayer Cu stripes attached to the steps of W(110) are distinguished from W terraces by scanning tunneling microscopy using a Cu-induced empty state, which is characterized by inverse photoemission spectroscopy. While the contrast between Cu and W atoms is dominated by the difference of the atomic sizes at most biases, it can be reversed with a bias such that tunneling into the Cu state overwhelms the size difference. This effect provides an unambiguous and well-understood mechanism for identifying different metal atoms. © 1994 The American Physical Society.
T.N. Morgan
Semiconductor Science and Technology
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Peter J. Price
Surface Science