Conference paperA model for negative bias temperature instability in oxide and high κ pFETsSufi ZafarICICDT 2007
PaperThreshold voltage instabilities in high-κ gate dielectric stacksSufi Zafar, Arvind Kumar, et al.IEEE T-DMR
PaperLocal environment affects the activity of enzymes on a 3D molecular scaffoldYan Xiong, James Huang, et al.ACS Nano
PaperCharge trapping related threshold voltage instabilities in high permittivity gate dielectric stacksSufi Zafar, Alessandro Callegari, et al.Journal of Applied Physics