G.W. Rubloff, P.S. Ho
Thin Solid Films
Extra Si density of states has been observed within about 3-4 of the Pd2Si-Si(111) interface. Spectral analysis indicated that most of these states exist near the Si band-gap region and originate from an atomic environment more Si rich than Pd2Si. Transmission-electron-microscopy lattice images showed a structurally sharp Pd2Si-Si interface with misfit dislocations and atomic-step imperfections. It is suggested that the interfacial bonding in such a structure can account for the observed interface states. © 1981 The American Physical Society.
G.W. Rubloff, P.S. Ho
Thin Solid Films
T.W. Poon, F.F. Abraham, et al.
EPL
H.-C.W. Huang, P.S. Ho
Applied Physics Letters
P.S. Ho
ECS Meeting 1984