Thin films and interfaces
- P.S. Ho
- K.N. Tu
- 2013
- MRS Bulletin
Publications
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118 results for Paul S. Ho
Nonlinear propagation of void front during electromigration in alloy films
- P.S. Ho
- J.K. Howard
- 2008
- Applied Physics Letters
Effect of substrate temperature on the microstructure of thin-film silicide
- U. Köster
- K.N. Tu
- et al.
- 2008
- Applied Physics Letters
Analysis of grain-boundary electromigration
- P.S. Ho
- 2008
- Journal of Applied Physics
Intermetallic compounds of Al and transitions metals: Effect of electromigration in 1-2-μm-wide lines
- J.K. Howard
- J.F. White
- et al.
- 2008
- Journal of Applied Physics
Effect of surface condition on diffusion in thin films at low temperatures
- J.C.M. Hwang
- P.S. Ho
- et al.
- 2008
- Applied Physics Letters
Contact reactions in Pd/GaAs junctions
- J.O. Olowolafe
- P.S. Ho
- et al.
- 2008
- Journal of Applied Physics
Grain boundary diffusion of aluminum in polycrystalline silicon films
- J.C.M. Hwang
- P.S. Ho
- et al.
- 2008
- Journal of Applied Physics
Ledge fluctuations on si(100) stepped surfaces.
- T.W. Poon
- F.F. Abraham
- et al.
- 2007
- EPL
Transmission electron microscopy of the formation of nickel silicides
- H. Föll
- P.S. Ho
- et al.
- 2006
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties