F. Zenhausern, Y. Martin, et al.
Science
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.
F. Zenhausern, Y. Martin, et al.
Science
David W. Abraham, T.J. Chainer, et al.
INTERMAG 2003
K. Gopalakrishnan, R.S. Shenoy, et al.
IEDM 2005
Y. Martin, S. Rishton, et al.
Applied Physics Letters