Conference paper
Thermal and photo thermal imaging on a sub 100 nanometer scale
C.C. Williams, H.K. Wickramasinghe
SPIE OE/LASE 1988
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.
C.C. Williams, H.K. Wickramasinghe
SPIE OE/LASE 1988
Philip C. D. Hobbs, David W. Abraham, et al.
Applied Physics Letters
C.C. Williams, H.K. Wickramasinghe
Nature
P.C.D. Hobbs, Y. Martin, et al.
Proceedings of SPIE 1989