M. Nonnenmacher, H.K. Wickramasinghe
Applied Physics Letters
Joule displacement microscopy, where the periodic expansion caused by Joule heating in a thin-film track carrying ac current is mapped using a focused probe, has recently been described. In this letter, we demonstrate the application of this technique to the study of current distribution within a bipolar inverting gate.
M. Nonnenmacher, H.K. Wickramasinghe
Applied Physics Letters
A.P. Ghosh, D.B. Dove, et al.
Microlithography 1992
R.J. Von Gutfeld, D.R. Vigliotti, et al.
Applied Physics Letters
Y. Martin, D. Rugar, et al.
Applied Physics Letters