Paper

01 Jan 1984

Summary Abstract: A Quantitative Ion Beam Process Applied to the Deposition of Aluminum Nitride Thin Films

View publication

Abstract

No abstract available.

Related

Conference paper

Half-integer Shapiro steps in strong ferromagnetic Josephson junctions

Poster

Dzyaloshinskii-Moriya interaction in Pt/Co/Re films

Paper

Synthesis of Cyclo[18]carbon via Debromination of C₁₈Br₆

Talk

Minimizing Power Outage For Energy And Utility Industry With Deep Learning

View all publications