R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Paper
Summary Abstract: Electromigration studies of al-intermetallic structures
Abstract
No abstract available.
Related
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME