S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Paper
Summary Abstract: The origin of oxidation induced enhancement of Si+ sputter yield in SIMS
Abstract
No abstract available.
Related
K.A. Chao
Physical Review B
A. Reisman, M. Berkenblit, et al.
JES
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules