Franco Stellari, Franco Zappa, et al.
IEEE Transactions on Electron Devices
Paper
Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS
Related
Conference paper
On-chip real-time power supply noise detector
Anuja Sehgal, Peilin Song, et al.
ESSCIRC 2006
Jing Li, Robert Montoye, et al.
VLSI Technology 2013
Conference paper
Latchup Analysis Using Emission Microscopy
Franco Stellari, Peilin Song, et al.
Microelectronics Reliability