Electronic Device Failure Analysis

Paper

01 Nov 2016

Superconducting single-photon detector enables time-resolved emission testing of low-voltage scaled ICS

Conference paper

Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurements

Franco Stellari, Peilin Song, et al.

ISTFA 2013

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On-chip real-time power supply noise detector

Anuja Sehgal, Peilin Song, et al.

ESSCIRC 2006

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Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits

Andrea Bahgat Shehata, Franco Stellari, et al.

ISTFA 2014

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Novel IC sub-threshold IDDQ signature and its relationship to aging during high voltage stress

Franco Stellari, Naigang Wang, et al.

ESSDERC 2018

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