S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
The ion-beam channeling technique has been used to characterize the interface and the first few layers of [100] GaSb/AlSb superlattice structures. Strain caused by alternating tensile and compressive stress has been detected by measuring the oscillation of the [110]-aligned direction with depth. From the angular displacement and its oscillation, the amount of strain in the superlattice has been determined directly. © 1983 The American Physical Society.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Robert W. Keyes
Physical Review B
Biancun Xie, Madhavan Swaminathan, et al.
EMC 2011