Conference paper
Structure of the silicon-oxide interface
Yuhai Tu, J. Tersoff
Thin Solid Films
Paper
Surface Stress and Self-Organization of Steps
Abstract
A Comment on the Letter by P. Hanesch and E. Bertel, Phys. Rev. Lett. 79, 1523 (1997). © 1998 The American Physical Society.
Related
L.E. Shilkrot, D.J. Srolovitz, et al.
Applied Physics Letters
J. Tersoff, Y.H. Phang, et al.
Physical Review Letters
J. Tersoff
Surface Science