O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
The scanning tunneling microscope (STM) is an important tool for studying the growth of ultrathin metal structures. The behavior of atoms arriving at the surface determines nanometer-scale structure that is readily measured with the STM. These structural features are important in determining properties. The variety of structural possibilities is illustrated with the difference between substrate-controlled island nucleation of Ni on Au(111) and diffussion-controlled aggregation of Ag on Au(111). The STM also provides a fairly complete picture of the intermixing that occurs in the early stages of room-temperature growth of Fe on Cu(100). © 1993.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
M. Hargrove, S.W. Crowder, et al.
IEDM 1998