E. Burstein
Ferroelectrics
The scanning tunneling microscope (STM) is an important tool for studying the growth of ultrathin metal structures. The behavior of atoms arriving at the surface determines nanometer-scale structure that is readily measured with the STM. These structural features are important in determining properties. The variety of structural possibilities is illustrated with the difference between substrate-controlled island nucleation of Ni on Au(111) and diffussion-controlled aggregation of Ag on Au(111). The STM also provides a fairly complete picture of the intermixing that occurs in the early stages of room-temperature growth of Fe on Cu(100). © 1993.
E. Burstein
Ferroelectrics
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Hiroshi Ito, Reinhold Schwalm
JES