Jacob Savir
IEEE TC
Classical testing of combinational circuits requires a list of the fault-free response of the circuit to the test set. For most practical circuits implemented today the large storage requirement for such a list makes such a test procedure very expensive. Moreover, the computational cost to generate the test set increases exponentially with the circuit size. In this paper we describe a method of designing combinational circuits in such a way that their test procedure will require the knowledge of only one characteristic of the fault-free circuit, called the syndrome. This solves the storage problem associated with the test procedure. The syndrome-test procedure does not require test vector generation, and thus the expensive stage of test generation and fault simulation is eliminated. Copyright © 1980 by The Institute of Electrical and Electronics Engineers, Inc.
Jacob Savir
IEEE TC
Jacob Savir
IEEE TC
Zeev Barzilai, Jacob Savir, et al.
IEEE TC
Jacob Savir, Gary S. Ditlow, et al.
IEEE TC