On-Chip Weighted Random Patterns
- Jacob Savir
- 1998
- Journal of Electronic Testing: Theory and Applications (JETTA)
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12 results for Jacob Savir
Delay Test Generation: A Hardware Perspective
- Jacob Savir
- 1997
- Journal of Electronic Testing: Theory and Applications (JETTA)
Layout Influences Testability
- Thomas H. Spencer
- Jacob Savir
- 1985
- IEEE TC
Random Pattern Testability
- Jacob Savir
- Gary S. Ditlow
- et al.
- 1984
- IEEE TC
On Random Pattern Test Length
- Jacob Savir
- Paul H. Bardell
- 1984
- IEEE TC
Good Controllability and Observability Do Not Guarantee Good Testability
- Jacob Savir
- 1983
- IEEE TC
A New Empirical Test for the Quality of Random Integer Generators
- Jacob Savir
- 1983
- IEEE TC
Syndrome-Testing of “Syndrome-Untestable” Combinational Circuits
- Jacob Savir
- 1981
- IEEE TC
The Weighted Syndrome Sums Approach to VLSI Testing
- Zeev Barzilai
- Jacob Savir
- et al.
- 1981
- IEEE TC
Detection of Single Intermittent Faults in Sequential Circuits
- Jacob Savir
- 1980
- IEEE TC