An Chen, Stefano Ambrogio, et al.
EDTM 2020
We introduce M/# as a metric for characterizing holographic memory systems. M/# is the constant of proportionality between diffraction efficiency and the number of holograms squared. Although M/# is a function of many variables in a holographic recording system, it can be measured from the recording and erasure of a single hologram. We verify experimentally that the diffraction efficiency of multiple holograms follows the prediction of M/# measured from a single hologram. © 1996 Optical Society of America.
An Chen, Stefano Ambrogio, et al.
EDTM 2020
Geoffrey W. Burr
SPIE Optical Science and Technology 2003
Katherine Spoon, Stefano Ambrogio, et al.
IMW 2020
Simone Raoux, Geoffrey W. Burr, et al.
IBM J. Res. Dev