PaperDefect generation in 3.5 nm silicon dioxide filmsD.A. Buchanan, D.J. DiMaria, et al.Applied Physics Letters
PaperElectroluminescence studies in silicon dioxide films containing tiny silicon islandsD.J. DiMaria, J.R. Kirtley, et al.Journal of Applied Physics
PaperHot-electron dynamics in SiO2 and the degradation of the Si/SiO2-interfaceE. Cartier, D.J. DiMariaMicroelectronic Engineering
PaperStudy of charge trapping as a degradation mechanism in electrically alterable read-only memoriesC. Falcony, D.J. DiMaria, et al.Journal of Applied Physics
