PaperVacuum emission of hot electrons from silicon dioxide at low temperaturesD.J. DiMaria, M.V. FischettiJournal of Applied Physics
Conference paperReliability projection for ultra-thin oxides at low voltageJ.H. Stathis, D.J. DiMariaIEDM 1998
PaperElectron heating in silicon dioxide and off-stoichiometric silicon dioxide filmsD.J. DiMaria, T.N. Theis, et al.Journal of Applied Physics
PaperDefect generation in field-effect transistors under channel-hot-electron stressD.J. DiMariaJournal of Applied Physics